| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Semiconductor convertors – General requirements and line commutated convertors – Part 1-1: Specifications of basic requirements
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На языке оригинала
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6480,00
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Semiconductor convertors - General requirements and line commutated convertors - Part 1-2:Application guide
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На языке оригинала
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9072,00
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Semiconductor convertors - General requirements and line commutated convertors - Part 1-3:Transformers and reactors
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На языке оригинала
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1555,00
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Printed electronics - Part 203: Materials - Semiconductor ink
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На языке оригинала
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4536,00
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Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor
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На языке оригинала
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2592,00
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Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method
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На языке оригинала
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1555,00
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Visual inspection for sliced and lapped silicon wafers
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На языке оригинала
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2592,00
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Method of measurement of etch pit density of germanium crystal
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На языке оригинала
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1555,00
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Measurement of minority carrier life time in germanium by photoconductive decay method
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На языке оригинала
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1555,00
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Determination of conductivity type in germanium by thermoelectromotive method method
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На языке оригинала
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1555,00
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Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
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На языке оригинала
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1555,00
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Test methods for measuring resistivity of electrically conductive ceramic thin films with Van der Pauw method
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На языке оригинала
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2592,00
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