| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Test methods for bare wires - Part 10: Test for continuity of coating - Ammonium persulphate solution method
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Published |
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На языке оригинала
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1037,00
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Test methods for bare wires - Part 11: Test for adherence of coating
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Published |
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На языке оригинала
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1037,00
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Test methods for bare wires - Part 12: Solderability test of coating - Solder globule method
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Published |
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На языке оригинала
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1253,00
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Tinned round copper wire
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Published |
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На языке оригинала
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1253,00
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Waste water from manufacturing process--Determination of total nitro compounds--Gas chromato-graphic method
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Published |
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На языке оригинала
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1037,00
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Determination of sulphuric acidmist in tail gas in sulphuric acid concentration process--Barium chromate colorimetric method
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Published |
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На языке оригинала
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1037,00
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Waste gasfrom manufacturing process--Determination of chemical oxygendemand and nitrogenoxide--Potassium dichromate oxidation and naphthylethylene diamine colorimetric method
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Published |
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На языке оригинала
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1037,00
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Fishing nets - Method of test for the determination of strength and breaking elongation of netting of synthetic fiber
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Published |
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На языке оригинала
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1253,00
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Beer
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Published |
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На языке оригинала
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1253,00
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Method for analysis of beer
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Published |
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На языке оригинала
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3283,00
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Lubricating grease--Determination of dropping point
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Published |
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На языке оригинала
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1037,00
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Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials (CRMs)
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Published |
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На языке оригинала
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1642,00
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Instrument for soil test - Shear apparatus - Part 1: Strain-controlled direct shear apparatus
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Published |
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На языке оригинала
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1253,00
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Instrument for soil test - Shear apparatus - Part 2пјљField vane shear apparatus
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Published |
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На языке оригинала
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1253,00
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Instrument for soil test - Oedometer - Part 1: Single level arm oedometer
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Published |
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На языке оригинала
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1253,00
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Instrument for soil test - Oedometer - Part 2: Pneumatic oedometer
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Published |
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На языке оригинала
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1253,00
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Semiconductor devices―Mechanical and climatic test methods―Part 1: General
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Published |
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На языке оригинала
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1037,00
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Semiconductor devices―Mechanical and climatic test methods―Part 2: Low air pressure
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Published |
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На языке оригинала
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1037,00
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Semiconductor devices - Mechanical and climatic tests methods - Part 3: External visual examination
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Published |
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На языке оригинала
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1037,00
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Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
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Published |
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На языке оригинала
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1037,00
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