| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Chemical analysis methods and determination of physical performance of alumina—Part 30: Determination of trace elements—Wavelength dispersive X-ray fluorescence spectrometric method
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На языке оригинала
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1339,00
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Chemical analysis methods and determination of physical performance of alumina - Part 31: Determination of angle of flow
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На языке оригинала
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1253,00
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Chemical analysis methods and determination of physical performance of alumina - Part 32: Determination of a-alumina content by X-ray diffraction
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На языке оригинала
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1037,00
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Chemical analysis methods and determination of physical performance of alumina - Part 33: Determination of attrition index
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На языке оригинала
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1253,00
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Chemical analysis methods and determination of physical performance of alumina - Part 34: Method of calculating alumina content
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На языке оригинала
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1037,00
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Chemical analysis methods and determination of physical performance of alumina—Part 35: Determination of specific surface area—Nitrogen adsorption method
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На языке оригинала
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1339,00
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Chemical analysis methods and determination of physical performance of alumina - Part 36: Determination of flow time
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На языке оригинала
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1253,00
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Terminology and metallographs for titanium and titanium alloys
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Published |
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На языке оригинала
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1858,00
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Titanium and titanium alloy castings
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Published |
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На языке оригинала
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1253,00
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Test method for resistivity of semiconductor wafers and sheet resistance of semiconductor films—Noncontact eddy-current gauge
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На языке оригинала
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1339,00
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Test method for measuring resistivity of silicon wafer using spreading resistance probe
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Published |
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На языке оригинала
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1253,00
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Test method for thickness and total thickness variation of silicon slices
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Published |
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На языке оригинала
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1253,00
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Test methods for bow of silicon wafers
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Published |
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На языке оригинала
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1253,00
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Test method for measuring warp on silicon slices by noncontact scanning
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Published |
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На языке оригинала
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1253,00
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Testing methods for surface flatness of silicon slices
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Published |
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На языке оригинала
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1037,00
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Standard method for measuring the surface quality of polished silicon slices by visual inspection
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Published |
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На языке оригинала
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1037,00
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Designations for lumbered synthetic quartz crystals
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Published |
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На языке оригинала
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1037,00
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General purpose rigid coaxial transmission lines and their associated flange connectors--Generic specification
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Published |
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На языке оригинала
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1253,00
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Granulated electric furnace phosphorous slag used for cement
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Published |
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На языке оригинала
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1037,00
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Chrysotile asbestos test methods
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Published |
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На языке оригинала
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1858,00
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