| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%) в рублях |
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Rare earth three-band phosphors for fluorescent lamps
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Published |
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На языке оригинала
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1253,00
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Test methods of rare earth three-band phosphors for fluorescent lamps - Part 1: Determination of relative brightness
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Published |
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На языке оригинала
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1037,00
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Test methods of rare earth three-band phosphors for fluorescent lamps - Part 2: Determination of emission dominantpeak and chromaticity
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Published |
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На языке оригинала
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1037,00
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Test methods of rare earth three-band phosphors for fluorescent lamps - Part 3: Determination of thermostability
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Published |
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На языке оригинала
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1037,00
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Test methods of rare earth three-band phosphors for fluorescent lamps - Part 5: Determination of density
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Published |
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На языке оригинала
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1037,00
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Test methods of rare earth three-band phosphors for fluorescent lamps - Part 6: Determination of specific surface area
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Published |
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На языке оригинала
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1037,00
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Test methods of rare earth three-band phosphors for fluorescent lamps - Part 7: Determination of temperature quenching
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Published |
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На языке оригинала
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1037,00
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Rare earth metals and their compounds—Determination of total rare earth content
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Published |
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На языке оригинала
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1339,00
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Tantalum and tantalum alloy rods
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Published |
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На языке оригинала
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1253,00
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Niobium and niobium alloys rods and bars
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Published |
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На языке оригинала
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1253,00
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Tianium sheet for plate heat exchangers
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Published |
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На языке оригинала
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1253,00
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Tolerances on dimensions and form of aluminium and aluminium alloy extruded profiles
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Published |
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На языке оригинала
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2549,00
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Methods for chemical analysis of silicon metal—Part 1:Determination of iron content
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Published |
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На языке оригинала
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1253,00
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Methods for chemical analysis of silicon metal - Part 2пјљDetermination of aluminum content - Chrome azurol S spectrophotometric method
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Published |
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На языке оригинала
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1037,00
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Methods for chemical analysis of silicon metal—Part 3:Determination of calcium content
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Published |
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На языке оригинала
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1253,00
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Methods for chemical analysis of silicon metal―Part 4:Determination of impurity contents―Inductively coupled plasma atomic emission spectrometric method
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Published |
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На языке оригинала
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1339,00
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Methods for chemical analysis of silicon metal―Part 5:Determination of impurity contents―X-ray fluorescence method
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Published |
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На языке оригинала
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1253,00
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Methods for chemical analysis of silicon metal―Part 6:Determination of carbon―Infrared absorption method
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Published |
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На языке оригинала
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1037,00
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Methods for chemical analysis of silicon metal—Part 7: Determination of phosphorus content—Phosphorus molybdenum blue spectrophotometry
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Published |
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На языке оригинала
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1037,00
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Methods for chemical analysis of silicon metal—Part 8: Determination of copper content—Atomic absorption spectrometric method
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Published |
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На языке оригинала
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1037,00
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