| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
|
|
Metallic materials—Bend testing method
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Metallic materials - Sheet and strip - Reverse bend test
|
Published |
|
На языке оригинала
|
1382,00
|
|
|
|
Metallic materials - Wire - Reverse bend test
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Metallic materials—Wire—Part1：Simple torsion test
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Metallic materials—Wire—Part 2: Reverse torsion test
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Metal materials-Tube - Hydrostatic pressure test
|
Published |
|
На языке оригинала
|
1382,00
|
|
|
|
Metal materials-Tube - Drift-expending test
|
Published |
|
На языке оригинала
|
1382,00
|
|
|
|
Metallic material—Tube—Bend test method
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Metallic materials—Tube—Flanging test
|
Published |
|
На языке оригинала
|
1382,00
|
|
|
|
Metallic materials—Tube—Flattening test
|
Published |
|
На языке оригинала
|
1382,00
|
|
|
|
Metallic materials—Resistivity measurement method
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Spring steels
|
Published |
|
На языке оригинала
|
3110,00
|
|
|
|
Method of measurement of density for precious metals and their alloys
|
Published |
|
На языке оригинала
|
1382,00
|
|
|
|
Method of measurement of resistivity of precious metals and their alloys
|
Published |
|
На языке оригинала
|
1382,00
|
|
|
|
Determination of melting temperature range for precious metals and their alloys—Testing method of thermal analysis
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Method for chemical analysis of metallurgy product - General rules and regulations
|
Published |
|
На языке оригинала
|
1382,00
|
|
|
|
Test methods for conductivity type of extrinsic semiconducting materials
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method
|
Published |
|
На языке оригинала
|
2822,00
|
|
|
|
Test methods for minority carrier lifetime in bulk silicon and germanium—Photoconductivity decay method
|
Published |
|
На языке оригинала
|
3110,00
|
|
|
|
Test methods for determining the orientation of a semiconductive single crystal
|
Published |
|
На языке оригинала
|
1670,00
|
|
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