| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
|
|
Steel sheets—Secondary work embrittlement test method
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Steel—Determination of Bake-Hardening-Index (BH)
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Metallic materials - Fatigue testing - Statistical planning and analysis of data
|
Published |
|
На языке оригинала
|
2477,00
|
|
|
|
Standard test methods for characterizing duplex grain sizes
|
Published |
|
На языке оригинала
|
2477,00
|
|
|
|
Macrostructure assessing method for solidification structure of continuous casting blank
|
Published |
|
На языке оригинала
|
1382,00
|
|
|
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Metallic materials—Residual stress determination—Indentation strain-gage method
|
Published |
|
На языке оригинала
|
2189,00
|
|
|
|
Mechanical testing of metals - Symbols and definitions in published standard
|
Published |
|
На языке оригинала
|
5702,00
|
|
|
|
Metallic materials—Sheet and Strip—Earing test
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Test method for measurement of hydrogen embrittlement threshold in steel by the incremental step loading method
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Steel wire ropes - Determination of the actual modulus of elasticity
|
Published |
|
На языке оригинала
|
1382,00
|
|
|
|
General rules for original position statistic distribution analysis method
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Test method for electrochemical properties of magnesium alloys sacrificial anode
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Metallic materials—Method of test for the determination of resistance to stable crack extension using specimens of low constraint
|
Published |
|
На языке оригинала
|
4378,00
|
|
|
|
Metallic materials—Test method for rapid indentation (Brinell type) hardness testing
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Metallic materials—Sheet and strip—Hole expanding test
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Test method for measuring surface metal contamination on semiconductor wafers —Total reflection X-Ray fluorescence spectroscopy
|
Published |
|
На языке оригинала
|
2189,00
|
|
|
|
Test method for Ⅲ and Ⅴ impurities content in single crystal silicon—Low temperature FT-IR analysis method
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Test method for measuring surface metal impurity content of polycrystalline silicon—Acid extraction-inductively coupled plasma mass spectrometry method
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Metallic materials—Tube—Ring-expanding test
|
Published |
|
На языке оригинала
|
1382,00
|
|
|
|
Metallic materials—Tube—Ring tensile test
|
Published |
|
На языке оригинала
|
1382,00
|
|
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