| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
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Small punch test methods of metallic materials for in-service pressure equipments - Part 1пјљGeneral requirements
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На языке оригинала
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1670,00
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Small punch test methods of metallic materials for in-service pressure equipments - Part 2пјљMethod of test for tensile properties at room temperature
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На языке оригинала
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1670,00
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Chemical analysis of ferric-containing dust and sludge by XRF-Fused cast bead method
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На языке оригинала
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1786,00
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Cold rolled steel sheet for enamelling - Fish-scaling sensitivity test - Hydrogen permeation method
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На языке оригинала
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1382,00
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Testing method for the forming limit diagram (FLD) of metal tube
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На языке оригинала
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1670,00
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Eddy current testing method of copper and copper-alloys rods, bars and wires
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Published |
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На языке оригинала
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1786,00
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Metallic materials - Method of constraint loss correction of CTOD fracture toughness for fracture assessment of steel components
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Published |
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На языке оригинала
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4666,00
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Standard terminology relating to metallography
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На языке оригинала
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7546,00
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Metallic materials - Tensile testing at high strain rates - Part 1: Elastic-bar-type systems
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На языке оригинала
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3744,00
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Metallic materials—Tensile testing at high strain rates—Part 2: Servo-hydraulic and other test systems
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На языке оригинала
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2189,00
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Superconductivity―Measurements for bulk high temperature superconductors―Trapped flux density of large grain oxide superconductors
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На языке оригинала
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2477,00
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Test method for crystal quality of III-nitride epitaxial layers
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На языке оригинала
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1670,00
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Test method for lattice constant of III-nitride epitaxial layers
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На языке оригинала
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1670,00
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Test methods for internal quantum efficiency of nitride LED epitaxial layers
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На языке оригинала
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1670,00
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Rating and classifying of inclusions in steel—Scanning electron microscope method
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Published |
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На языке оригинала
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3168,00
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Standard test method for thickness and thickness variation on sapphire substrates
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Published |
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На языке оригинала
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1382,00
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Test method for warp and waviness of silicon wafers for solar cells
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Published |
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На языке оригинала
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1786,00
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Test methods for surface roughness and saw mark of silicon wafers for solar cells
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Published |
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На языке оригинала
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1786,00
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Test method for thickness and total thickness variation of silicon wafers for solar cell
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Published |
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На языке оригинала
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1670,00
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Test method for stress of monocrystalline sapphire ingot
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Published |
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На языке оригинала
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1670,00
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