| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
|
|
Non-destructive testing of steel tubes—Automated ultrasonic testing for the detection of laminar imperfections in strip/plate used for the manufacture of welded steel tubes
|
Published |
|
На языке оригинала
|
1339,00
|
|
|
|
Non-destructive testing of steel tubes—Automated ultrasonic testing of the weld seam of welded steel tubes for the detection of longitudinal and/or transverse imperfections
|
Published |
|
На языке оригинала
|
1339,00
|
|
|
|
Non-destructive testing of steel tubes—Magnetic particle inspection of seamless and welded ferromagnetic steel tubes for the detection of surface imperfections
|
Published |
|
На языке оригинала
|
1253,00
|
|
|
|
Test method for crystalline quality of semiconductive single crystal—X-ray diffraction method
|
Published |
|
На языке оригинала
|
1253,00
|
|
|
|
Non-destructive testing (NDT) methods of steel tubes—Liquid penetrant inspection of seamless and welded steel tubes for the detection of surface imperfections
|
Published |
|
На языке оригинала
|
1253,00
|
|
|
|
Test method for gloss of silicon wafer
|
Published |
|
На языке оригинала
|
1253,00
|
|
|
|
Metallic materials—High strain rate compression test method at elevated temperature
|
Published |
|
На языке оригинала
|
2117,00
|
|
|
|
Test method for surface defects on silicon carbide epitaxial wafers—Laser scattering method
|
Published |
|
На языке оригинала
|
1858,00
|
|
|
|
Metallic materials—Testing methods for creep crack and creep-fatigue crack growth rates
|
Published |
|
На языке оригинала
|
2160,00
|
|
|
|
Test method for thickness of silicon carbide epitaxial layer—Infrared reflectance method
|
Published |
|
На языке оригинала
|
1253,00
|
|
|
|
Test method for excess-charge-carrier recombination lifetime in silicon ingots, silicon bricks and silicon wafers—Noncontact eddy-current sensor
|
Published |
|
На языке оригинала
|
1642,00
|
|
|
|
Test method for fracture toughness of aluminium alloy products
|
Published |
|
На языке оригинала
|
3024,00
|
|
|
|
Metallic materials—Methods for creep-fatigue damage assessment and life prediction
|
Published |
|
На языке оригинала
|
1987,00
|
|
|
|
Metallic materials—Elastic modulus measurement—Rate-jump method
|
Published |
|
На языке оригинала
|
1339,00
|
|
|
|
Metallic materials—Sheet and strip—Shear test method at room temperature
|
Published |
|
На языке оригинала
|
1642,00
|
|
|
|
Test method for surface quality and micropipe density of polished silicon carbide wafers—Confocal and differential interferometry optics
|
Published |
|
На языке оригинала
|
1123,00
|
|
|
|
Test method for flow pattern defects in silicon wafer—Etching technique
|
Published |
|
На языке оригинала
|
1123,00
|
|
|
|
Methods for plane bending fatigue of copper alloy elastic strip
|
Published |
|
На языке оригинала
|
1253,00
|
|
|
|
Steel wire ropes—Creep testing method
|
Published |
|
На языке оригинала
|
1037,00
|
|
|
|
Methods for chemical analysis of nickel-platinum target alloys—Part 1： Determination of platinum content—Inductively coupled plasma atomic emission spectrometry
|
Published |
|
На языке оригинала
|
1253,00
|
|
| Страницы: ... / 20 / 21 / 22 / 23 / 24 / 25 / 26 / 27 / 28 |