| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Measuring method for electromagnetic parameters of liquid materials at microwave frequencies using an open-ended coaxial probe
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Published |
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На языке оригинала
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1642,00
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Calculation of effects of short-circuit currents—Part 1: Definitions and calculation methods
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Published |
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На языке оригинала
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2808,00
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Calculation of effects of short-circuit currents—Part 2: Examples of calculation
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Published |
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На языке оригинала
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3715,00
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Platinum-40%rhodium/platinum-20%rhodium thermocomouple wires and temperature-electromotive force(EMF) tables
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Published |
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На языке оригинала
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1642,00
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Industrial process control devices—Radiation thermometers—Part 1: Technical data for radiation thermometers
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Published |
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На языке оригинала
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1642,00
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Industrial process control devices—Radiation thermometers—Part 2：Determination of the technical data for radiation thermometers
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Published |
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На языке оригинала
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1858,00
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Sheathed continuous thermocouple cables and sheathed continuous thermocouple
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Published |
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На языке оригинала
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1642,00
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Nanotechnologies—Raman shift standard curve for spectrometer calibration
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Published |
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На языке оригинала
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1339,00
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Nanotechnology—Characterization of CdSe quantum dot nanocrystal—Fluorescence spectroscopy
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Published |
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На языке оригинала
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1339,00
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Liquefied natural gas dispenser for vehicle
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Published |
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На языке оригинала
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1858,00
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Special design external micrometer with electronic digital display
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Published |
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На языке оригинала
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1858,00
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Ion chromatographs
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Published |
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На языке оригинала
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1858,00
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Vortex precession flowmeters for gas
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Published |
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На языке оригинала
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1642,00
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Volume conversion device for gas meter
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Published |
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На языке оригинала
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2808,00
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Intelligent pressure instrumentпјЌGeneral technical requirements
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Published |
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На языке оригинала
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1858,00
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Test method of water balance in cement production enterprises
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Published |
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На языке оригинала
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1123,00
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Electronic theodolite
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Published |
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На языке оригинала
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2549,00
|
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Nanotechnology—Method for the measurement of the nanofilm-thickness by atomic force microscopy
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Published |
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На языке оригинала
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1253,00
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Testing equipment for digital input electricity meters
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Published |
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На языке оригинала
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2117,00
|
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Nanotechnologies—Test method of semiconductor nanopowder using UV-Vis diffuse reflectance spectroscopy
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Published |
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На языке оригинала
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1642,00
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