Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%) в рублях |
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General specification for fiber bragg grating sensing system for space application
|
Published |
На языке оригинала
|
1613,00
|
|
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Characterization of the performance of illuminance meters and luminance meters
|
Published |
На языке оригинала
|
2369,00
|
|
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Micro nano standard samplesпј€geometricпј‰
|
Published |
На языке оригинала
|
1613,00
|
|
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Geometrical product specifications (GPS) — Guidelines for the evaluation of coordinate measuring machine (CMM) test uncertainty for CMMs using single and multiple stylus contacting probing systems
|
Published |
На языке оригинала
|
1058,00
|
|
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Metric series wires for the pitch diameters of screw threads
|
Published |
На языке оригинала
|
1058,00
|
|
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Design and metrological characteristics of dial test indicatorsпј€lever typeпј‰
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Published |
На языке оригинала
|
1613,00
|
|
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Design and metrological characteristics of mechanical dial gauges
|
Published |
На языке оригинала
|
1411,00
|
|
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Opto-electronic measurement—Performance requirements and test methods of light distribution measurement system
|
Published |
На языке оригинала
|
1814,00
|
|
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Requirements and test methods for electrostatic shielding packaging bags
|
Published |
На языке оригинала
|
1411,00
|
|
|
Geometrical product specifications (GPS)—Systematic errors and contributions to measurement uncertainty of length measurement due to thermal influences
|
Published |
На языке оригинала
|
2369,00
|
|
|
Superconducting electronic devices—Generic specification for sensors and detectors
|
Published |
На языке оригинала
|
1814,00
|
|
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Technical specifications and testing methods for cesium atomic clock
|
Published |
На языке оригинала
|
1814,00
|
|
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Electronic characteristic measurements—Local critical current density and its distribution in large-area superconducting films
|
Published |
На языке оригинала
|
2772,00
|
|
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Power quality measurement in power supply systems—Part 1: Power quality instruments (PQI)
|
Published |
На языке оригинала
|
1966,00
|
|
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Power quality measurement in power supply systems—Part 2: Functional tests and uncertainty requirements
|
Published |
На языке оригинала
|
6552,00
|
|
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Method for measuring refractive index of uniaxial optical crystals
|
Published |
На языке оригинала
|
1058,00
|
|
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Nanotechnology—Contacting methods for measuring the resistivity of nanomaterials—General rules
|
Published |
На языке оригинала
|
1966,00
|
|
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Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)
|
Published |
На языке оригинала
|
2167,00
|
|
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Nanotechnologies—Measurement of the number of layers of graphene-related two-dimensional (2D) materials—Raman spectroscopy method
|
Published |
На языке оригинала
|
1966,00
|
|
|
Nanotechnologies—Measurement of the number of layers of graphene-related two-dimensional (2D) materials—Optical contrast method
|
Published |
На языке оригинала
|
1814,00
|
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