| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Opto-electronic measurement—Performance requirements and test methods of light distribution measurement system
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Published |
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На языке оригинала
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2117,00
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Requirements and test methods for electrostatic shielding packaging bags
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Published |
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На языке оригинала
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1642,00
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Geometrical product specifications (GPS)—Systematic errors and contributions to measurement uncertainty of length measurement due to thermal influences
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Published |
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На языке оригинала
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2808,00
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Superconducting electronic devices—Generic specification for sensors and detectors
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Published |
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На языке оригинала
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2117,00
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Technical specifications and testing methods for cesium atomic clock
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Published |
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На языке оригинала
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2117,00
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Electronic characteristic measurements—Local critical current density and its distribution in large-area superconducting films
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Published |
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На языке оригинала
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2333,00
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Power quality measurement in power supply systems—Part 1: Power quality instruments (PQI)
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Published |
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На языке оригинала
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2333,00
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Power quality measurement in power supply systems—Part 2: Functional tests and uncertainty requirements
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Published |
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На языке оригинала
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6350,00
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Method for measuring refractive index of uniaxial optical crystals
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Published |
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На языке оригинала
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1253,00
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Nanotechnology—Contacting methods for measuring the resistivity of nanomaterials—General rules
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Published |
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На языке оригинала
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1987,00
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Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)
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Published |
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На языке оригинала
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2117,00
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Nanotechnologies—Measurement of the number of layers of graphene-related two-dimensional (2D) materials—Raman spectroscopy method
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Published |
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На языке оригинала
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2333,00
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Nanotechnologies—Measurement of the number of layers of graphene-related two-dimensional (2D) materials—Optical contrast method
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Published |
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На языке оригинала
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2117,00
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Test method for refractive index of infrared optical chalcogenide films
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Published |
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На языке оригинала
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1210,00
|
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Calibration specification of measurement instrument for power frequency magnetic field
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Published |
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На языке оригинала
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1858,00
|
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General specification for PXI Express bus modules
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Published |
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На языке оригинала
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2549,00
|
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General specification for PXI bus modules
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Published |
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На языке оригинала
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2549,00
|
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Geometrical product specifications (GPS)—Geometrical precision verification—Part 1：Basic concept and measurement—Symbol, terminology, measuring conditions and procedures
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Published |
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На языке оригинала
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1339,00
|
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Geometrical product specifications (GPS)—Geometrical precision verification—Part 2：Verification of form characteristics, orientation characteristics, position characteristics, run-out characteristics and profile characteristics
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Published |
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На языке оригинала
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5098,00
|
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Geometrical product specifications (GPS)—Geometrical precision verification—Part 3：Functional gauges and fixtures—Verification when applying maximum material requirements and minimum material requirements
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Published |
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На языке оригинала
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1339,00
|
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