| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
|
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Test method for parameters of thermoelectric terahertz detector
|
Published |
|
На языке оригинала
|
1642,00
|
|
|
|
The quality control method of magnetic resonance imaging or spectrometer
|
Published |
|
На языке оригинала
|
2117,00
|
|
|
|
Test method for diffraction efficiency of imaging diffractive optical elements
|
Published |
|
На языке оригинала
|
1253,00
|
|
|
|
Methods for the preparation of Rydberg atoms for quantum precision measurement
|
Published |
|
На языке оригинала
|
1253,00
|
|
|
|
Requirements and test methods for performances of the atom gravimeters
|
Published |
|
На языке оригинала
|
1642,00
|
|
|
|
Characterization and measurement of the performance of single-photon sources
|
Published |
|
На языке оригинала
|
1253,00
|
|
|
|
Characterization and measurement of the performance of optical clocks
|
Published |
|
На языке оригинала
|
1642,00
|
|
|
|
Radiometric measurement methods of ultraviolet radiation sources
|
Published |
|
На языке оригинала
|
1858,00
|
|
|
|
A weak static magnetic field imaging method based on scanning nitrogen-vacancy probe
|
Published |
|
На языке оригинала
|
1642,00
|
|
|
|
Testing method for nano geometric standard samples
|
Published |
|
На языке оригинала
|
1642,00
|
|
|
|
Standard meter for AC electrical energy
|
Published |
|
На языке оригинала
|
3024,00
|
|
|
|
Environmental noise emitted by vessels
|
Published |
|
На языке оригинала
|
1339,00
|
|
|
|
Cabin noise prediction for ships based on statistical energy analysis
|
Published |
|
На языке оригинала
|
2117,00
|
|
|
|
Test specification of integrating sphere source for remote sensor calibration
|
Published |
|
На языке оригинала
|
1642,00
|
|
|
|
Test method for underwater radiated noise from ships
|
Published |
|
На языке оригинала
|
3024,00
|
|
|
|
Nanotechnology—Determination of the uniformity of SERS solid substrate—Raman mapping analysis
|
Published |
|
На языке оригинала
|
1642,00
|
|
|
|
Nanotechnologies—Test methods for measurement of electrical properties of carbon nanotubes
|
Published |
|
На языке оригинала
|
1858,00
|
|
|
|
Determination of optical center distance in photoelectric system—Low coherence interferometry
|
Published |
|
На языке оригинала
|
1858,00
|
|
|
|
Determination of wavefront aberration in optical systems—Electro-optical Shack-Hartmann method
|
Published |
|
На языке оригинала
|
1858,00
|
|
|
|
Nanotechnologies—Technical requirements for dynamic light scattering particle size analyzers
|
Published |
|
На языке оригинала
|
1642,00
|
|
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