| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 22%)
в рублях |
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Microbeam analysis-Electron backscatter diffraction-Measurement of average grain size
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Published |
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На языке оригинала
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2027,00
|
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Determination of hollow fiber membrane cross-section dimensions-Image analysis method
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Published |
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На языке оригинала
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1282,00
|
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Determination of pore size for porous membranes-Standard particle method
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Published |
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На языке оригинала
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1282,00
|
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Nanotechnologies-Characterization of single-wall carbon nanotubes using ultraviolet-visible-near infrared (UV-Vis-NIR) absorption spectroscopy
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Published |
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На языке оригинала
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1778,00
|
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Nanotechnologies-Guidance on physico-chemical characterization of engineered nanoscale materials for toxicologic assessment
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Published |
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На языке оригинала
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2440,00
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Reclaimed water quality-Determination of benzene homologues-Gas chromatography
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Published |
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На языке оригинала
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1199,00
|
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Reclaimed water quality-Determination of anionic surfactants-Methylene blue spectrophotometric method
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Published |
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На языке оригинала
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993,00
|
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Reclaimed water quality-Determination of fluoride,chloride,nitrite,nitrate,sulfate-Ion chromatography
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Published |
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На языке оригинала
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1199,00
|
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Reclaimed water quality-Determination of total arsenic-Atomic fluorescence spectrometry
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Published |
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На языке оригинала
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993,00
|
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Chemical reagent-General rules for inductively coupled plasma mass spectrometry
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Published |
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На языке оригинала
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1778,00
|
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Determination of certain substances in electrical and electronic products-Part 4: Mercury in polymers, metals and electronics by CV-AAS, CV-AFS , ICP-OES and ICP-MS
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Published |
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На языке оригинала
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1778,00
|
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|
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Determination of certain substances in electrical and electronic products-Part 5: Cadmiumlead and chromium in polymers and electronics and cadmium and lead in metals by AASAFSICP-OES and ICP-MS
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Published |
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На языке оригинала
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2440,00
|
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Determination of certain substances in electrical and electronic products-Part 7-2:Hexavalent chrome-Determination of hexavalent chrome[Cr(VI)]in polymers and electronics by the colormetric method
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Published |
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На языке оригинала
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1282,00
|
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Determination of benzene,methylbenzene,ethylbenzene,dimethybenzene in stationery-Gas chromatographic method
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Published |
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На языке оригинала
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1199,00
|
|
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Surface chemical analysis-Secondary-ion mass spectrometry-Method for depth profiling of boron in silicon
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Published |
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На языке оригинала
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1282,00
|
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Surface chemical analysis-Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
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Published |
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На языке оригинала
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2027,00
|
|
|
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Surface chemical analysis-Atomic force microscopy-Test method for thickness of the two-dimensional layered molybdenum disulfide nanosheets
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Published |
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На языке оригинала
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1778,00
|
|
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Surface chemical analysis-Secondary ion mass spectrometry-Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
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Published |
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На языке оригинала
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1572,00
|
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Measuring method for surface areas of materials-Three dimensional area measurement base on hyperspectral imaging
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Published |
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На языке оригинала
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1282,00
|
|
|
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Determination of 5 kinds of ammonium chloride antibacterial agents in toothpaste-High performance liquid chromatography method
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Published |
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На языке оригинала
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1199,00
|
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