| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 22%)
в рублях |
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Determination of performance of pressurized fluid extractor
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Published |
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На языке оригинала
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1282,00
|
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|
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Expression of performance of fluorometric oxygen analyzers in liquid media
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Published |
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На языке оригинала
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2688,00
|
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|
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Nanotechnologies-Generation of metal nanoparticles for inhalation toxicity testing-Evaporation-condensation method
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Published |
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На языке оригинала
|
2027,00
|
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Analysis of water used in boiler and cooling system-Determination of phosphate, chloride, silicate, total alkalinity, phenolphthalein alkalinity, hardness and iron-Spectrophotometric detection by discrete analysis systems
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Published |
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На языке оригинала
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1282,00
|
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Microbeam analysis-Focused ion beam-Preparation of TEM specimens
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Published |
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На языке оригинала
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1572,00
|
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Microbeam analysis-FIB-SEM imaging and analysis method for 3D micro-pore structure of rock sample
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Published |
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На языке оригинала
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2233,00
|
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Microbeam analysis-Transmission electron microscopy-Preparation methods of ultrathin section of polymer composites
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Published |
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На языке оригинала
|
1572,00
|
|
|
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Nanotechnology-Measurement of pore size and pore size distribution of nanoporous materials-Fluorescence probe method
|
Published |
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На языке оригинала
|
2027,00
|
|
|
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Surface chemical analysis-Secondary ion mass spectrometry-Linearity of intensity scale in single ion counting time-of-flight mass analysers
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Published |
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На языке оригинала
|
2027,00
|
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Surface chemical analysis-X-ray photoelectron spectroscopy-Estimating and reporting detection limits for elements in homogeneous materials
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Published |
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На языке оригинала
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2027,00
|
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Surface chemical analysis-Atomic force microscopy-Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
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Published |
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На языке оригинала
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2027,00
|
|
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Surface chemical analysis-Electron spectroscopies-Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
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Published |
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На языке оригинала
|
2027,00
|
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Surface chemical analysis-Near real-time information from the X-ray photoelectron spectroscopy survey scan-Rules for identification of, and correction for, surface contamination by carbon-containing compounds
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Published |
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На языке оригинала
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1572,00
|
|
|
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Microbeam analysis-Scanning electron microscopy-Method for evaluating critical dimensions by CD-SEM
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Published |
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На языке оригинала
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3557,00
|
|
|
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General rule for determination of nitrogen content by Dumas combustion method
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Published |
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На языке оригинала
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1282,00
|
|
|
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Microbeam analysis-Analytical electron microscopy-Method for the determination of energy resolution for electron energy loss spectrum analysis
|
Published |
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На языке оригинала
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2440,00
|
|
|
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Surface chemical analysis-Glow discharge mass spectrometry-Operating procedures
|
Published |
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На языке оригинала
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1778,00
|
|
|
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Surface chemical analysis-X-ray photoelectron spectroscopy-Procedures for determining backgrounds
|
Published |
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На языке оригинала
|
1282,00
|
|
|
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Surface chemical analysis-Auger electron spectroscopy-Derivation of chemical information
|
Published |
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На языке оригинала
|
1572,00
|
|
|
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General rule for liquid chromatography-mass spectrometry
|
Published |
|
На языке оригинала
|
1282,00
|
|
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