| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Determination of certain substances in electrical and electronic products—Part 4: Mercury in polymers, metals and electronics by CV-AAS, CV-AFS , ICP-OES and ICP-MS
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Published |
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На языке оригинала
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2477,00
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Determination of certain substances in electrical and electronic products—Part 5: Cadmium，lead and chromium in polymers and electronics and cadmium and lead in metals by AAS，AFS，ICP-OES and ICP-MS
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Published |
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На языке оригинала
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3398,00
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Determination of certain substances in electrical and electronic products—Part 7-2:Hexavalent chrome—Determination of hexavalent chrome[Cr(VI)]in polymers and electronics by the colormetric method
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Published |
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На языке оригинала
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1786,00
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Measuring method for surface areas of materials—Three dimensional area measurement base on hyperspectral imaging
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Published |
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На языке оригинала
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1786,00
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Method for analysing CCA and ACQ in preservative-treated wood and wood preservatives by X-ray fluorescence spectroscopy
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Published |
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На языке оригинала
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1382,00
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Chemicals—Liquid or solid identification—Fluidity test method
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Published |
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На языке оригинала
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1382,00
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Nanotechnologies—Characterization of multiwall carbon nanotubes—Mesoscopic shape factors
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Published |
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На языке оригинала
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2189,00
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Nanotechnologies—Determination of the concentration of nanometer titanium dioxide airborne dust in workplace—Spectrophotometry method
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Published |
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На языке оригинала
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2189,00
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Nanotechnology—Measurement of metallic impurities in graphene powder—Inductively coupled plasma mass spectrometry
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Published |
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На языке оригинала
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2822,00
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Nanotechnology—Measurement for specific surface area of graphene powder—Static volumetric method by argon gas adsorption
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Published |
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На языке оригинала
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2822,00
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Medium temperature pattern material for investment casting—Part 1：Test method of physical properties
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Published |
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На языке оригинала
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1670,00
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Medium temperature pattern material for investment casting —Part 2: Test method of application performance
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Published |
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На языке оригинала
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1670,00
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Microbeam analysis—Analytical electron microscopy—Method for the determination of interface position in the cross-sectional image of the layered materials
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Published |
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На языке оригинала
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4032,00
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Microbeam analysis—Analytical electron microscopy—Measurement of the dislocation density in thin metals
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Published |
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На языке оригинала
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2880,00
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Nanotechnology—Measurement of defect concentration of graphene—Raman spectroscopy method
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Published |
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На языке оригинала
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3110,00
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Microbeam analysis—Analytical electron microscopy—Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
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Published |
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На языке оригинала
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2822,00
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Nanotechnology—Measurement methods for carrier mobility and sheet resistance of graphene films of sub-nanometer thickness
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Published |
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На языке оригинала
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2477,00
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Microbeam analysis—Electron probe microanalyser (EPMA)—Guidelines for performing quality assurance procedures
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Published |
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На языке оригинала
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3110,00
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Nanotechnologies—Measurement of the hydrogen storage capacity of nanoporous materials—Gas adsorption method
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Published |
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На языке оригинала
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2189,00
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General rule for liquid chromatography-mass spectrometry
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Published |
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На языке оригинала
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1786,00
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