| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Surface chemical analysis—Auger electron spectroscopy—Description of selected instrumental performance parameters
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Published |
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На языке оригинала
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1670,00
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Thickness measurements for ultrathin silicon oxide layers on silicon wafers X-ray photoelectron spectroscopy
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Published |
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На языке оригинала
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1670,00
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Safety guideling for the evaluation of toxic and flammable gas detection systems
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Published |
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На языке оригинала
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1670,00
|
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Examination of nitrite bacteria in industrial circulating cooling water - MPN test
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Published |
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На языке оригинала
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1670,00
|
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Methods for measuring super amphiphilicity of nanomaterials
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Published |
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На языке оригинала
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1382,00
|
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Methods for measuring super hydrophobicity of nanomaterials
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Published |
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На языке оригинала
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1670,00
|
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Determination of particle in gases - Light-scattering method - Part 1пјљDetermination of particle in pipeline gases
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Published |
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На языке оригинала
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1670,00
|
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Determination of trace hydrogen,oxygen,methane and carbon monoxide in the inert gases - Gas chromatographic method
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Published |
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На языке оригинала
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1382,00
|
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Determination of hazardous materials in air separation process - Part 1: Determination of hydrocarbons
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Published |
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На языке оригинала
|
1670,00
|
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Surface chemical analysis пјЌ Auger electron spectroscopy and X-ray photoelectron spectroscopy пјЌ Determination of lateral resolution
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Published |
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На языке оригинала
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2477,00
|
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Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
|
Published |
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На языке оригинала
|
1786,00
|
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Gas analysis - Gas chromatograph with helium ionization detector
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Published |
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На языке оригинала
|
1786,00
|
|
|
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Gas analysis - Determination of sulfides - Gas chromatograph with flame photometric detector
|
Published |
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На языке оригинала
|
1670,00
|
|
|
|
Surface chemical analysis—X-ray photoelectron spectroscopy—Description of selected instrumental performance parameters
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Methods used to determine peak intensities and information required when reporting results
|
Published |
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На языке оригинала
|
2477,00
|
|
|
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Surface chemical analysis - Handling of specimens prior to analysis
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Published |
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На языке оригинала
|
1670,00
|
|
|
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Analysis of water used in boil and cooling system - Determination of chloride - Ammonium thiocyanate titration method
|
Published |
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На языке оригинала
|
1382,00
|
|
|
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Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - determination of lateral resolution, analysis area, and sample area viewed by the analyser
|
Published |
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На языке оригинала
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2189,00
|
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|
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Surface chemical analysis - Depth profiling - Measurment of sputtered depth
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Published |
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На языке оригинала
|
1786,00
|
|
|
|
Surface chemical analysis - Auger electron spectroscopy - Repeatability and constancy of intensity scale
|
Published |
|
На языке оригинала
|
1786,00
|
|
| Страницы: 1 / 2 / 3 / 4 / 5 / 6 / 7 / 8 / 9 / 10 / 11 / 12 |