Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%) в рублях |
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Safety of machinery—Laser processing machines—Part 3:Noise reduction and noise measurement methods for laser processing machines and hand-held processing devices and associated auxiliary equipment (accuracy grade 2)
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Published |
На языке оригинала
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2189,00
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Electromechanical switches for use in electronic equipment Part 4-1:Sectional specification for lever(toggle)switches Blank detail specification
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Published |
На языке оригинала
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1670,00
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Electromechanical switches for use in electronic equipment--Part 4:Sectional specification for lever(toggle) switches
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Published |
На языке оригинала
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1786,00
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Semiconductor devices--Integrated circuits--Part 4:Interface integrated circuits--Section 1:Blank detail specification for linear digital-to-analogue converters(DAC)
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Published |
На языке оригинала
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2189,00
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Semiconductor devices--Integrated circuits--Part 4:Interface integrated circuits--Section 2:Blank detail specification for linear analogue-to-digital converters(ADC)
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Published |
На языке оригинала
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2189,00
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Connectors with assessed qualityпјЊfor use in d.c.пјЊlow frequency analogue and in digital high speed data applications--Part 1:Generic specification
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Published |
На языке оригинала
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2822,00
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Connectors for use in d.c.пјЊlow-frequency analogue and digital high speed data spplications--Part 2:Circular connectors with assessed quality--Sectional specification
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Published |
На языке оригинала
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2477,00
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Mechanical structures for electronic equipment Tests for IEC 60917 and IEC 60297 - Part 1: Climatic, mechanical tests and safety aspects for cabinets, racks, subracks and chassis
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Published |
На языке оригинала
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2189,00
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Mechanical structures for electronic equipment—Tests for metric and inch system—Part 2: Seismic tests for cabinets and racks
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Published |
На языке оригинала
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1786,00
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Mechanical structures for electronic equipment—Tests for metric and inch system—Part 3: Electromagnetic shielding performance tests for cabinets and subracks
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Published |
На языке оригинала
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1786,00
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Mechanical structures for electronic equipment—Tests for metric and inch system—Part 4: Combination of performance levels for modular cabinets
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Published |
На языке оригинала
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1670,00
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Mechanical structures for electronic equipment—Tests for metric and inch system—Part 5: Seismic tests for chassis, subracks and plug-in units
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Published |
На языке оригинала
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2477,00
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The transparent conductive glass withindium-tin oxide films used in liquid crystal display
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Published |
На языке оригинала
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1786,00
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General specification for the resistance strain pressure transducer/sensor
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Published |
На языке оригинала
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2477,00
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Semiconductor devices--Part 12-1:Optoelectronic devices--Blank detail specification for light emitting/infrared emitting diodes with/without pigtail for fiber optic systems or sub-systems
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Published |
На языке оригинала
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1786,00
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Semiconductor devices--Part 12-2:Optoelectronic devices--Blank detail specification for laser diodes modules with pigtail for fiber optic systems or sub-systems
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Published |
На языке оригинала
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2189,00
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Semiconductor devices--Part 12-3:Optoelectronic devices--Blank detail specification for light-emitting diodes--Display application
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Published |
На языке оригинала
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1670,00
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Semiconductor devices--Part 12-4:Optoelectronicdevices--Blank detail specification for pin-FET modules with/without pigtailfor fiber optic systems or sub-systems
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Published |
На языке оригинала
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1786,00
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Semiconductor devices--Part 12-5: Optoelectronic devices--Blank detail specification for pin-photodiodes with/without pigtailпјЊfor fibre optic systems or subsystems
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Published |
На языке оригинала
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1786,00
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Liquid crystal display devices—Part 2: Liquid crystal display modules—Sectional specification
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Published |
На языке оригинала
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1786,00
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