| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Synthetic quartz crystal wafer for optical low pass filter (OLPF)
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Published |
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На языке оригинала
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1339,00
|
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|
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General rules for bonding sheet for multilayer printed boards
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Published |
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На языке оригинала
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1339,00
|
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|
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Test methods for bongding sheet for multilayer printed boards
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Published |
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На языке оригинала
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2808,00
|
|
|
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Determination of 2,4-dinitro-toluene in electrical and electronic products—Gas chromatography-mass spectrometry
|
Published |
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На языке оригинала
|
1253,00
|
|
|
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Determination of short chain chlorinated paraffins in electrical and electronic products—Gas chromatography-mass spectrometry
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Published |
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На языке оригинала
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1339,00
|
|
|
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Determination of arsenic,beryllium,antimony in electrical and electronic products—Part 1:Inductively coupled plasma mass spectrometry spectrometry
|
Published |
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На языке оригинала
|
1253,00
|
|
|
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Determination of arsenic, beryllium, antimony in electrical and electronic products—Part 2: Inductively coupled plasma optical emission spectrometry
|
Published |
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На языке оригинала
|
1253,00
|
|
|
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Determination of restricted substances including tributyltin and triphenyltin in electrical and electronic products—Gas chronatography-mass spectrometry
|
Published |
|
На языке оригинала
|
1253,00
|
|
|
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Nanotechnologies—Electrical operating parameter test specification of wafer level nano-scale phase change memory cells
|
Published |
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На языке оригинала
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1598,00
|
|
|
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Quality assessment systems—Part 1: Registration and analysis of defects on printed board assemblies
|
Published |
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На языке оригинала
|
1339,00
|
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|
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Wafer level test methods for MEMS piezoresistive pressure-sensitive die performances
|
Published |
|
На языке оригинала
|
1339,00
|
|
|
|
Test methods of the performance for MEMS high g accelerometer
|
Published |
|
На языке оригинала
|
1339,00
|
|
|
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Requirements of optical radiation safety for LED general lighting service
|
Published |
|
На языке оригинала
|
1339,00
|
|
|
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Measuring methods of optical radiation safety for LED general lighting service
|
Published |
|
На языке оригинала
|
1123,00
|
|
|
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Capacitors for high voltage direct current transfer switches
|
Published |
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На языке оригинала
|
2117,00
|
|
|
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Super capacitors—Part 1:General
|
Published |
|
На языке оригинала
|
2117,00
|
|
|
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Micro-electromechanical system technology—Measuring method for in-plane length measurements of MEMS microstructures using an optical interferometer
|
Published |
|
На языке оригинала
|
1253,00
|
|
|
|
Micro-electromechanical system technology—Measuring method for strain gradient measurements of MEMS microstructures using an optical interferometer
|
Published |
|
На языке оригинала
|
1339,00
|
|
|
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Micro electromechanical system technology—Test method for the nonlinear vibration of the MEMS resonant sensitive element
|
Published |
|
На языке оригинала
|
1339,00
|
|
|
|
Micro-electromechanical system technology—Measuring method of microstructure surface stress based on Raman spectroscopy
|
Published |
|
На языке оригинала
|
1339,00
|
|
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