| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Determination of restricted substances including tributyltin and triphenyltin in electrical and electronic products—Gas chronatography-mass spectrometry
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Published |
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На языке оригинала
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1670,00
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Nanotechnologies—Electrical operating parameter test specification of wafer level nano-scale phase change memory cells
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Published |
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На языке оригинала
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2131,00
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Quality assessment systems—Part 1: Registration and analysis of defects on printed board assemblies
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Published |
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На языке оригинала
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1786,00
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Wafer level test methods for MEMS piezoresistive pressure-sensitive die performances
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Published |
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На языке оригинала
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1786,00
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Test methods of the performance for MEMS high g accelerometer
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Published |
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На языке оригинала
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1786,00
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Requirements of optical radiation safety for LED general lighting service
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Published |
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На языке оригинала
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1786,00
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Measuring methods of optical radiation safety for LED general lighting service
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Published |
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На языке оригинала
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1498,00
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Capacitors for high voltage direct current transfer switches
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Published |
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На языке оригинала
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2822,00
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Super capacitors—Part 1:General
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Published |
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На языке оригинала
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2822,00
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Micro-electromechanical system technology—Measuring method for in-plane length measurements of MEMS microstructures using an optical interferometer
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Published |
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На языке оригинала
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1670,00
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Micro-electromechanical system technology—Measuring method for strain gradient measurements of MEMS microstructures using an optical interferometer
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Published |
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На языке оригинала
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1786,00
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Micro electromechanical system technology—Test method for the nonlinear vibration of the MEMS resonant sensitive element
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Published |
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На языке оригинала
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1786,00
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Micro-electromechanical system technology—Measuring method of microstructure surface stress based on Raman spectroscopy
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Published |
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На языке оригинала
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1786,00
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Micro-electromechanical system technology—Measuring method for residual strain measurements of MEMS microstructures using an optical interferometer
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Published |
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На языке оригинала
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1786,00
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On-site measurements of obstrusive light of LED panals
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Published |
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На языке оригинала
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1382,00
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Connectors—Safety requirements and tests
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Published |
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На языке оригинала
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3744,00
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Microwave circuits—Measuring methoels for noise source
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Published |
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На языке оригинала
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1670,00
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Microwave circuits—Measuring methods for frequency source
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Published |
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На языке оригинала
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2189,00
|
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Test methods for endurance and data retention of non-volatile memory
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Published |
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На языке оригинала
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1670,00
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Logic digital integrated circuits—Specification for I/O interface model for integrated circuit
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Published |
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На языке оригинала
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4723,00
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