| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
|
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Semiconductor optoelectronic devices—Blank detail specification for power light-emitting diodes
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Semiconductor optoelectronic devices—Blank detail specification for lower power light-emitting diodes
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Semiconductor optoelectronic devices—Blank detail specification for middle power light-emitting diodes
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Accelerated life test method for LED
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Point estimation and interval estimation for reliability testing of LED applied products (exponential distribution)
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Semiconductor integrated circuit—Measuring methods for double data rate 3 synchronous dynamic random access memory(DDR3 SDRAM)
|
Published |
|
На языке оригинала
|
2189,00
|
|
|
|
General specification for metal base copper-clad laminates for printed circuits
|
Published |
|
На языке оригинала
|
3110,00
|
|
|
|
Semiconductor integrated circuit—Measuring methods for flash memory
|
Published |
|
На языке оригинала
|
2189,00
|
|
|
|
Integrated circuits—Test methods for column grid array
|
Published |
|
На языке оригинала
|
2477,00
|
|
|
|
Probe test method for light emitting diode chips
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Integrated circuits—Memory devices pin configuration
|
Published |
|
На языке оригинала
|
2189,00
|
|
|
|
Equipment for preparation of nitride semiconductor materials by hydride vapor phase epitaxy
|
Published |
|
На языке оригинала
|
2189,00
|
|
|
|
Organic light-emitting diode （OLED）lighting—Terminology and letter symbols
|
Published |
|
На языке оригинала
|
2822,00
|
|
|
|
Semiconductor lighting terminology
|
Published |
|
На языке оригинала
|
3110,00
|
|
|
|
Safety requirements for insulated chassis
|
Published |
|
На языке оригинала
|
2477,00
|
|
|
|
Cabinets for low-voltage switchgear—Electrical mechanical structures
|
Published |
|
На языке оригинала
|
2477,00
|
|
|
|
Cabinets for low-voltage switchgear—Mechanical structures for drawout functional unit
|
Published |
|
На языке оригинала
|
2477,00
|
|
|
|
Test method for pyroelectric coefficient of materials under DC bias field
|
Published |
|
На языке оригинала
|
1382,00
|
|
|
|
Lasers and laser-related equipment—Standard optical components—Part 1: Components for the UV,visible and near-infrared spectral ranges
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Lasers and laser-related equipment—Standard optical components—Part 2: Components for the infrared spectral ranges
|
Published |
|
На языке оригинала
|
1670,00
|
|
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