| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
|
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Microwave circuits—Measuring methods for voltage controlled oscillater
|
Published |
|
На языке оригинала
|
1642,00
|
|
|
|
General specification for MEMS electric field sensor
|
Published |
|
На языке оригинала
|
1642,00
|
|
|
|
Test methods of optical performance for Erbium-doped Yttrium Aluminum Garnet laser crystal
|
Published |
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На языке оригинала
|
1253,00
|
|
|
|
Measuring methods of optical radiation safety for semiconductor lighting equipments and systems
|
Published |
|
На языке оригинала
|
1253,00
|
|
|
|
Evaluation requirements for obtrusive light of LED panels
|
Published |
|
На языке оригинала
|
1037,00
|
|
|
|
Technical specification for power light-emitting diode chips
|
Published |
|
На языке оригинала
|
1642,00
|
|
|
|
Technical specification for middle power light-emitting diode chips
|
Published |
|
На языке оригинала
|
1642,00
|
|
|
|
Semiconductor optoelectronic devices—Blank detail specification for power light-emitting diodes
|
Published |
|
На языке оригинала
|
1339,00
|
|
|
|
Semiconductor optoelectronic devices—Blank detail specification for lower power light-emitting diodes
|
Published |
|
На языке оригинала
|
1339,00
|
|
|
|
Semiconductor optoelectronic devices—Blank detail specification for middle power light-emitting diodes
|
Published |
|
На языке оригинала
|
1339,00
|
|
|
|
Accelerated life test method for LED
|
Published |
|
На языке оригинала
|
1339,00
|
|
|
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Point estimation and interval estimation for reliability testing of LED applied products (exponential distribution)
|
Published |
|
На языке оригинала
|
1253,00
|
|
|
|
Semiconductor integrated circuit—Measuring methods for double data rate 3 synchronous dynamic random access memory(DDR3 SDRAM)
|
Published |
|
На языке оригинала
|
1642,00
|
|
|
|
General specification for metal base copper-clad laminates for printed circuits
|
Published |
|
На языке оригинала
|
2333,00
|
|
|
|
Semiconductor integrated circuit—Measuring methods for flash memory
|
Published |
|
На языке оригинала
|
1642,00
|
|
|
|
Integrated circuits—Test methods for column grid array
|
Published |
|
На языке оригинала
|
1858,00
|
|
|
|
Probe test method for light emitting diode chips
|
Published |
|
На языке оригинала
|
1253,00
|
|
|
|
Integrated circuits—Memory devices pin configuration
|
Published |
|
На языке оригинала
|
1642,00
|
|
|
|
Equipment for preparation of nitride semiconductor materials by hydride vapor phase epitaxy
|
Published |
|
На языке оригинала
|
1642,00
|
|
|
|
Organic light-emitting diode （OLED）lighting—Terminology and letter symbols
|
Published |
|
На языке оригинала
|
2117,00
|
|
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