| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Optics and photonics—Microlens array—Part 2:Test methods for wavefront aberrations
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Published |
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На языке оригинала
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2189,00
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Micro-electromechanical systems technology（MEMS） —Description and measurement methods for micro trench and pyramidal needle structures
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Published |
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На языке оригинала
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3456,00
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Test methods of the performances for MEMS piezoresistive pressure-sensitive device
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Published |
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На языке оригинала
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1786,00
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Connectors for electronic equipment—Product requierments—Rectangular connectors—Part 5: Detail specification for rewirable power connectors with snap locking for rated voltage of 250 V d.c. and rated current of 30 A
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Published |
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На языке оригинала
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2822,00
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Point to Point (P2P) signal interface for liquid crystal display panels—Transport protocols
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Published |
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На языке оригинала
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5760,00
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Point to Point (P2P) signal interface for liquid crystal display panels—Electrical parameters
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Published |
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На языке оригинала
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2189,00
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Method for measuring optical and laser performance for Chromium and Erbium co-doped Yttrium Scandium Gallium Garnet laser crystal
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Published |
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На языке оригинала
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3110,00
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Potentiometers for use in electronic equipment—Part 6-1:Blank detail specification—Surface mount preset potentiometers—Assessment level EZ
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Published |
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На языке оригинала
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1786,00
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Lasers and laser-related equipment—Test methods for the spectral characteristics of lasers
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Published |
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На языке оригинала
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2822,00
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Technical requirements and testing methods of BDS/GNSS high precision system on chip (SoC)
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Published |
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На языке оригинала
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2477,00
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Micro-electromechanical systems technology—Gyroscopes
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Published |
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На языке оригинала
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5299,00
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Electronic components—Long-term storage of electronic semiconductor devices—Part 1：General
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Published |
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На языке оригинала
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3110,00
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Electronic components—Long-term storage of electronic semiconductor devices—Part 2：Deterioration mechanisms
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Published |
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На языке оригинала
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2189,00
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Electronic components—Long-term storage of electronic semiconductor devices—Part 5：Die and wafer devices
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Published |
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На языке оригинала
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2189,00
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Semiconductor devices—Micro-electromechanical devices—Part 5: RF MEMS switches
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Published |
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На языке оригинала
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3398,00
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Semiconductor devices—Micro-electromechanical devices—Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
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Published |
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На языке оригинала
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3168,00
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Semiconductor devices—Micro-electromechanical devices—Part 19: Electronic compasses
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Published |
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На языке оригинала
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2880,00
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Technical requirements for L band 75kW continuous wave magnetron
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Published |
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На языке оригинала
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2477,00
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Microwave circuit—Measuring methods for electrically controlled attenuator
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Published |
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На языке оригинала
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2477,00
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Measuring methods of optical radiation safety for wearable devices
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Published |
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На языке оригинала
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2189,00
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