| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Electronic components—Long-term storage of electronic semiconductor devices—Part 1：General
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Published |
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На языке оригинала
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2333,00
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Electronic components—Long-term storage of electronic semiconductor devices—Part 2：Deterioration mechanisms
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Published |
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На языке оригинала
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1642,00
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Electronic components—Long-term storage of electronic semiconductor devices—Part 5：Die and wafer devices
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Published |
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На языке оригинала
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1642,00
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Semiconductor devices—Micro-electromechanical devices—Part 5: RF MEMS switches
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Published |
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На языке оригинала
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2549,00
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Semiconductor devices—Micro-electromechanical devices—Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
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Published |
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На языке оригинала
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2376,00
|
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Semiconductor devices—Micro-electromechanical devices—Part 19: Electronic compasses
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Published |
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На языке оригинала
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2160,00
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Technical requirements for L band 75kW continuous wave magnetron
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Published |
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На языке оригинала
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1858,00
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Microwave circuit—Measuring methods for electrically controlled attenuator
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Published |
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На языке оригинала
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1858,00
|
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Measuring methods of optical radiation safety for wearable devices
|
Published |
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На языке оригинала
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1642,00
|
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Semiconductor integrated circuits—System on chip(SoC)
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Published |
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На языке оригинала
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1339,00
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Microwave semiconductor integrated circuits—Frequency mixer
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Published |
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На языке оригинала
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2333,00
|
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Microwave semiconductor integrated circuits—Amplifier
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Published |
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На языке оригинала
|
1339,00
|
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Semiconductor integrated circuits—Measuring method of Holzer circuit
|
Published |
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На языке оригинала
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1339,00
|
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Semiconductor integrated circuits—Analog digital（AD） converter
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Published |
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На языке оригинала
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2333,00
|
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Semiconductor intergrated circuits—Test method of direct digital frequency synthesizer
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Published |
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На языке оригинала
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2549,00
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Micro-electromechanical systems（MEMS）technology—Bending strength test method for microstructures of silicon based MEMS
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Published |
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На языке оригинала
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1339,00
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Micro-electromechanical systems（MEMS） technology—Impact test method for nanostructures of silicon based MEMS
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Published |
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На языке оригинала
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1339,00
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Micro-electromechanical systems（MEMS） technology—Tensile strength test method for nano-scale membranes of silicon based MEMS
|
Published |
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На языке оригинала
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1339,00
|
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Integrated circuits—Measurement of electromagnetic immunity—Part 1: General conditions and definitions
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Published |
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На языке оригинала
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1858,00
|
|
|
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Integrated circuits—Measurement of electromagnetic immunity—Part 2: Measurement of radiated immunity—TEM cell and wideband TEM cell method
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Published |
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На языке оригинала
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2117,00
|
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