| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
|
|
Semiconductor integrated circuits—System on chip(SoC)
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Microwave semiconductor integrated circuits—Frequency mixer
|
Published |
|
На языке оригинала
|
3110,00
|
|
|
|
Microwave semiconductor integrated circuits—Amplifier
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Semiconductor integrated circuits—Measuring method of Holzer circuit
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Semiconductor integrated circuits—Analog digital（AD） converter
|
Published |
|
На языке оригинала
|
3110,00
|
|
|
|
Semiconductor intergrated circuits—Test method of direct digital frequency synthesizer
|
Published |
|
На языке оригинала
|
3398,00
|
|
|
|
Micro-electromechanical systems（MEMS）technology—Bending strength test method for microstructures of silicon based MEMS
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Micro-electromechanical systems（MEMS） technology—Impact test method for nanostructures of silicon based MEMS
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Micro-electromechanical systems（MEMS） technology—Tensile strength test method for nano-scale membranes of silicon based MEMS
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Integrated circuits—Measurement of electromagnetic immunity—Part 1: General conditions and definitions
|
Published |
|
На языке оригинала
|
2477,00
|
|
|
|
Integrated circuits—Measurement of electromagnetic immunity—Part 2: Measurement of radiated immunity—TEM cell and wideband TEM cell method
|
Published |
|
На языке оригинала
|
2822,00
|
|
|
|
Integrated circuits—Measurement of electromagnetic immunity—Part 8: Measurement of radiated immunity—IC stripline method
|
Published |
|
На языке оригинала
|
2362,00
|
|
|
|
Displacement damage test method for components
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Semiconductor integrated circuits—Measuring methods of video encoder and decoder circuits
|
Published |
|
На языке оригинала
|
3110,00
|
|
|
|
Microwave circuits—Test methods for detector
|
Published |
|
На языке оригинала
|
2477,00
|
|
|
|
Semiconductor integrated circuits—Digital-analog（DA）converter
|
Published |
|
На языке оригинала
|
3398,00
|
|
|
|
Semiconductor integrated circuits—Flash memory(FLASH)
|
Published |
|
На языке оригинала
|
2189,00
|
|
|
|
Semiconductor integrated circuits—Test method of driver device
|
Published |
|
На языке оригинала
|
2822,00
|
|
|
|
Nanotechnology—Nano-enabled optoelectrical display— Measurement of optical performance for quantum dot enabled light conversion film
|
Published |
|
На языке оригинала
|
2362,00
|
|
|
|
Nanotechnology—Nano-enabled optoelectrical display—Optical reliability assessment for quantum dot enabled light conversion film
|
Published |
|
На языке оригинала
|
1786,00
|
|
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