| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Integrated circuits—Measurement of electromagnetic immunity—Part 4: Direct RF power injection method
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Published |
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На языке оригинала
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1858,00
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Integrated circuits—Measurement of electromagnetic immunity—Part 8: Measurement of radiated immunity—IC stripline method
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Published |
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На языке оригинала
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1771,00
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Displacement damage test method for components
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Published |
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На языке оригинала
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1253,00
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Semiconductor integrated circuits—Measuring methods of video encoder and decoder circuits
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Published |
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На языке оригинала
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2333,00
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Microwave circuits—Test methods for detector
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Published |
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На языке оригинала
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1858,00
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Semiconductor integrated circuits—Digital-analog（DA）converter
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Published |
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На языке оригинала
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2549,00
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Semiconductor integrated circuits—Flash memory(FLASH)
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Published |
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На языке оригинала
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1642,00
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Semiconductor integrated circuits—Test method of driver device
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Published |
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На языке оригинала
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2117,00
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Nanotechnology—Nano-enabled optoelectrical display— Measurement of optical performance for quantum dot enabled light conversion film
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Published |
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На языке оригинала
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1771,00
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Nanotechnology—Nano-enabled optoelectrical display—Optical reliability assessment for quantum dot enabled light conversion film
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Published |
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На языке оригинала
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1339,00
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Workmanship requirements for rework, modification and repair of soldered electronic assemblies
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Published |
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На языке оригинала
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2333,00
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Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
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Published |
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На языке оригинала
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1642,00
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Measurement techniques of piezoelectric,dielectric and electrostatic oscillators—Part 2: Phase jitter measurement method
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Published |
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На языке оригинала
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1858,00
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Measuring methods of converter modules for high voltage input power supplies
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Published |
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На языке оригинала
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3715,00
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Integrated circuits—Measurement of impulse immunity—Part 2: Synchronous transient injection method
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Published |
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На языке оригинала
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2117,00
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Integrated circuits—Measurement of impulse immunity—Part 3: Non-synchronous transient injection method
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Published |
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На языке оригинала
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2333,00
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Semiconductor devices—Integrated circuits—Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits—Section 1: Requirements for internal visual examination
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Published |
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На языке оригинала
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1858,00
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Semiconductor integrated circuits—Test method of AC/DC converters
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Published |
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На языке оригинала
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3024,00
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Hybrid integrated circuits—DC/DC converter
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Published |
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На языке оригинала
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1642,00
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Requirements of flatness control for printed boards and printed board assemblies
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Published |
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На языке оригинала
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1253,00
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