| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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4 Mb/s digital time division command/response multiplex data bus test plan
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Published |
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На языке оригинала
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4450,00
|
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Remote operation and maintenance of integrated circuit packaging equipment—Status monitoring
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Published |
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На языке оригинала
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1858,00
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Evaluation requirements for visual comfort of indoor LED displays
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Published |
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На языке оригинала
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1253,00
|
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Evaluation methods for visual comfort of indoor LED displays
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Published |
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На языке оригинала
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1642,00
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Rules for the representation of infrared image temperature—Method by RGB
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Published |
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На языке оригинала
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3499,00
|
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Transparent display devices—Part 41: Measuring methods—Optical performance
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Published |
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На языке оригинала
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2808,00
|
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Image measurement method for numerical aperture of microscopic objective
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Published |
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На языке оригинала
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1642,00
|
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Epoxide woven E-glass prepreg for multilayer printed boards
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Published |
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На языке оригинала
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2117,00
|
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Requirements for load ports of 300mm semiconductor equipment
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Published |
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На языке оригинала
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1339,00
|
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Micro-electromechanical systems (MEMS) technology—Environmental test methods of MEMS piezoelectric thin films for sensor application
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Published |
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На языке оригинала
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1858,00
|
|
|
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Micro-electromechanical systems (MEMS) technology—Four-point bending test method for interfacial adhesion energy of layered MEMS materials
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Published |
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На языке оригинала
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1339,00
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Micro-electromechanical systems (MEMS) technology—Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
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Published |
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На языке оригинала
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1642,00
|
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Micro-electromechanical systems (MEMS) technology—Wafer curvature and cantilever beam deflection test methods for determining residual stresses of MEMS films
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Published |
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На языке оригинала
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1339,00
|
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Micro-electromechanical systems（MEMS）technology—Radio frequency MEMS circulators and isolators
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Published |
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На языке оригинала
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2549,00
|
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Micro-electromechanical systems（MEMS）technology—Technical specification of automotive grade pressure sensor based on MEMS technology
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Published |
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На языке оригинала
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1642,00
|
|
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Optics crystal—Ultraviolet grade calcium fluride crystal
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Published |
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На языке оригинала
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1339,00
|
|
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Laser and laser-related equipment—Absorption distribution measurement of optical laser components—Photothermal mapping method
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Published |
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На языке оригинала
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2117,00
|
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Requirements for wafer carrier handoff parallel I/O interface
|
Published |
|
На языке оригинала
|
2808,00
|
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|
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Electrostatic discharge sensitivity testing—Transmission line pulse(TLP)—Component level
|
Published |
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На языке оригинала
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1858,00
|
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|
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Microwave circuits—Measuring methods for limiter
|
Published |
|
На языке оригинала
|
1858,00
|
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