| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Specification for metrology pattern cells for integrated circuit manufacture
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Published |
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На языке оригинала
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1339,00
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Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits--Section two--Family specification for HCMOS digital integrated circuits series 54/74HCпјЊ54/74HCTпјЊ54/74HCU
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Published |
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На языке оригинала
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1858,00
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Semiconductor devices--integratedcircuits--Part 2:Digital integrated circuits--Section three--Blank detail specification for HCMOS digital integrated circuits series 54/74HCпјЊ54/74HCTпјЊ54/74HCU
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Published |
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На языке оригинала
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1339,00
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Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits--Section Four:Family specification for complementary MOS digital integrated circuitsпјЊseries 4000B and 4000UB
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Published |
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На языке оригинала
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1339,00
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Semiconductor devices - Integrated circuits - Part 2-9: Digital integrated circuits - Blank detail specification for MOS ultraviolet light erasable electrically programmable read-only memories
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Published |
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На языке оригинала
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1642,00
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Semiconductor devices--Integrated circuits--Part 2-10:Digital integrated circuits--Blank detail specification for integrated circuit dynamicread/write memories
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Published |
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На языке оригинала
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1642,00
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Semiconductor devices - Integrated circuits - Part 2-11: Digital integrated circuits - Blank detail specification for single supply integrated circuit electrically erasable and programmable read-only memory
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Published |
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На языке оригинала
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1339,00
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Semiconductor devices - Integrated circuits - Part 2-20пјљDigital integrated circuits - Family specification - Low voltage integrated circuits
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Published |
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На языке оригинала
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1037,00
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Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits
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Published |
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На языке оригинала
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7603,00
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CD Metrology procedures
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Published |
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На языке оригинала
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1253,00
|
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Specification for measuring depth of focus and best focus
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Published |
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На языке оригинала
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1253,00
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Guideline for programmed defect masks and benchmark procedures for sensitivity analysisof mask defect inspection systems
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Published |
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На языке оригинала
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1339,00
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Semiconductor devices--Integrated circuits--Part 3:Analogue integrated circuits
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Published |
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На языке оригинала
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6998,00
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Semiconductor devices--Integrated circuits--Part 4:Interface integrated circuits--Section 1:Blank detail specification for linear digital-to-analogue converters(DAC)
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Published |
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На языке оригинала
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1642,00
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Semiconductor devices--Integrated circuits--Part 4:Interface integrated circuits--Section 2:Blank detail specification for linear analogue-to-digital converters(ADC)
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Published |
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На языке оригинала
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1642,00
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Test method for measuring the resistance of package leads
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Published |
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На языке оригинала
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1037,00
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Semiconductor devices--Integrated circuits--Part 11:Section 1:Internal visual examination for semiconductor integrated circuits(excluding hybrid circuits)
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Published |
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На языке оригинала
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2117,00
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Mnemonics and symbols for integrated ciruuits
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Published |
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На языке оригинала
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2333,00
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Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
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Published |
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На языке оригинала
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1642,00
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Semiconductor devices—Part 16-10: Technology Approval Schedule for monolithic microwave integrated circuits
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Published |
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На языке оригинала
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3499,00
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| Страницы: 1 / 2 / 3 / 4 / 5 / 6 / 7 / 8 |