| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
|
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Photobiological safety of lamps and lamp systems—Part 5: Image projectors
|
Published |
|
На языке оригинала
|
3398,00
|
|
|
|
General specification for semiconductor lasers
|
Published |
|
На языке оригинала
|
2189,00
|
|
|
|
Test methods of semiconductor lasers
|
Published |
|
На языке оригинала
|
3398,00
|
|
|
|
Evaluation and test methods for beam quality of high energy laser
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Requirements of optical radiation safety for LED general lighting service
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Measuring methods of optical radiation safety for LED general lighting service
|
Published |
|
На языке оригинала
|
1498,00
|
|
|
|
Test methods of optical performance for Erbium-doped Yttrium Aluminum Garnet laser crystal
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Measuring methods of optical radiation safety for semiconductor lighting equipments and systems
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Technical specification for power light-emitting diode chips
|
Published |
|
На языке оригинала
|
2189,00
|
|
|
|
Technical specification for middle power light-emitting diode chips
|
Published |
|
На языке оригинала
|
2189,00
|
|
|
|
Semiconductor optoelectronic devices—Blank detail specification for power light-emitting diodes
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Semiconductor optoelectronic devices—Blank detail specification for lower power light-emitting diodes
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Semiconductor optoelectronic devices—Blank detail specification for middle power light-emitting diodes
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Accelerated life test method for LED
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Point estimation and interval estimation for reliability testing of LED applied products (exponential distribution)
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Probe test method for light emitting diode chips
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Organic light-emitting diode （OLED）lighting—Terminology and letter symbols
|
Published |
|
На языке оригинала
|
2822,00
|
|
|
|
Semiconductor lighting terminology
|
Published |
|
На языке оригинала
|
3110,00
|
|
|
|
Lasers and laser-related equipment—Standard optical components—Part 1: Components for the UV,visible and near-infrared spectral ranges
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Lasers and laser-related equipment—Standard optical components—Part 2: Components for the infrared spectral ranges
|
Published |
|
На языке оригинала
|
1670,00
|
|
| Страницы: 1 / 2 / 3 / 4 / 5 / 6 |