| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 22%)
в рублях |
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Photobiological safety of lamps and lamp systems-Part 3: Guidelines for the safe use of intense pulsed light source equipment on humans
|
Published |
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На языке оригинала
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1696,00
|
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|
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Photobiological safety of lamps and lamp systems-Part 4: Measuring methods
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Published |
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На языке оригинала
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3557,00
|
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Photobiological safety of lamps and lamp systems-Part 5: Image projectors
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Published |
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На языке оригинала
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2440,00
|
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|
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Photobiological safety of lamps and lamp systems-Part 6: Ultraviolet lamp products
|
Published |
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На языке оригинала
|
2895,00
|
|
|
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General specification for semiconductor lasers
|
Published |
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На языке оригинала
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1572,00
|
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Test methods of semiconductor lasers
|
Published |
|
На языке оригинала
|
2440,00
|
|
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Evaluation and test methods for beam quality of high energy laser
|
Published |
|
На языке оригинала
|
1282,00
|
|
|
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Requirements of optical radiation safety for LED general lighting service
|
Published |
|
На языке оригинала
|
1282,00
|
|
|
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Measuring methods of optical radiation safety for LED general lighting service
|
Published |
|
На языке оригинала
|
1075,00
|
|
|
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Test methods of optical performance for Erbium-doped Yttrium Aluminum Garnet laser crystal
|
Published |
|
На языке оригинала
|
1199,00
|
|
|
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Measuring methods of optical radiation safety for semiconductor lighting equipments and systems
|
Published |
|
На языке оригинала
|
1199,00
|
|
|
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Technical specification for power light-emitting diode chips
|
Published |
|
На языке оригинала
|
1572,00
|
|
|
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Technical specification for middle power light-emitting diode chips
|
Published |
|
На языке оригинала
|
1572,00
|
|
|
|
Semiconductor optoelectronic devices-Blank detail specification for power light-emitting diodes
|
Published |
|
На языке оригинала
|
1282,00
|
|
|
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Semiconductor optoelectronic devices-Blank detail specification for lower power light-emitting diodes
|
Published |
|
На языке оригинала
|
1282,00
|
|
|
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Semiconductor optoelectronic devices-Blank detail specification for middle power light-emitting diodes
|
Published |
|
На языке оригинала
|
1282,00
|
|
|
|
Accelerated life test method for LED
|
Published |
|
На языке оригинала
|
1282,00
|
|
|
|
Point estimation and interval estimation for reliability testing of LED applied products (exponential distribution)
|
Published |
|
На языке оригинала
|
1199,00
|
|
|
|
Probe test method for light emitting diode chips
|
Published |
|
На языке оригинала
|
1199,00
|
|
|
|
Organic light-emitting diode OLEDlighting-Terminology and letter symbols
|
Published |
|
На языке оригинала
|
2027,00
|
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| Страницы: 1 / 2 / 3 / 4 / 5 / 6 / 7 |