| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Photobiological safety of lamps and lamp systems—Part 3: Guidelines for the safe use of intense pulsed light source equipment on humans
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Published |
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На языке оригинала
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1771,00
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Photobiological safety of lamps and lamp systems—Part 4: Measuring methods
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Published |
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На языке оригинала
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3715,00
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Photobiological safety of lamps and lamp systems—Part 5: Image projectors
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Published |
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На языке оригинала
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2549,00
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General specification for semiconductor lasers
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Published |
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На языке оригинала
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1642,00
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Test methods of semiconductor lasers
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Published |
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На языке оригинала
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2549,00
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Evaluation and test methods for beam quality of high energy laser
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Published |
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На языке оригинала
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1339,00
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Requirements of optical radiation safety for LED general lighting service
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Published |
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На языке оригинала
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1339,00
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Measuring methods of optical radiation safety for LED general lighting service
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Published |
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На языке оригинала
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1123,00
|
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Test methods of optical performance for Erbium-doped Yttrium Aluminum Garnet laser crystal
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Published |
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На языке оригинала
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1253,00
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Measuring methods of optical radiation safety for semiconductor lighting equipments and systems
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Published |
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На языке оригинала
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1253,00
|
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Technical specification for power light-emitting diode chips
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Published |
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На языке оригинала
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1642,00
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Technical specification for middle power light-emitting diode chips
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Published |
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На языке оригинала
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1642,00
|
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Semiconductor optoelectronic devices—Blank detail specification for power light-emitting diodes
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Published |
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На языке оригинала
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1339,00
|
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Semiconductor optoelectronic devices—Blank detail specification for lower power light-emitting diodes
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Published |
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На языке оригинала
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1339,00
|
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Semiconductor optoelectronic devices—Blank detail specification for middle power light-emitting diodes
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Published |
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На языке оригинала
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1339,00
|
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Accelerated life test method for LED
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Published |
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На языке оригинала
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1339,00
|
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Point estimation and interval estimation for reliability testing of LED applied products (exponential distribution)
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Published |
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На языке оригинала
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1253,00
|
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Probe test method for light emitting diode chips
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Published |
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На языке оригинала
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1253,00
|
|
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Organic light-emitting diode （OLED）lighting—Terminology and letter symbols
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Published |
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На языке оригинала
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2117,00
|
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Semiconductor lighting terminology
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Published |
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На языке оригинала
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2333,00
|
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| Страницы: 1 / 2 / 3 / 4 / 5 / 6 |