Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%) в рублях |
|
Enamelled round winding wire - Part 18: Polyesterimide enamelled round copper wire,class 180,with a bonding layer
|
Published |
На языке оригинала
|
1670,00
|
|
|
Enamelled round winding wire - Part 19: Polyester or polyesterimide overcoated with polyamide-imide enamelled round copper wire,class 200,with a bonding layer
|
Published |
На языке оригинала
|
1670,00
|
|
|
Enamelled round winding wire - Part 20: Polyester or polyesterimide overcoated with polyamide-imide enamelled round copper wire,class 200
|
Published |
На языке оригинала
|
1382,00
|
|
|
Enamelled round winding wire - Part 21: Polyester-amide-imide enamelled round copper wire,class 200
|
Published |
На языке оригинала
|
1382,00
|
|
|
Enamelled round winding wire - Part 22: Aromatic polyimide enamelled round copper wire,class 240
|
Published |
На языке оригинала
|
1382,00
|
|
|
Enamelled round winding wire - Part 23: Solderable polyurethane enamelled round copper wire,class 180
|
Published |
На языке оригинала
|
1382,00
|
|
|
Technical parameters and requirements for oil-immersed power transformers
|
Published |
На языке оригинала
|
6221,00
|
|
|
Photovoltaic devices--Part 1:Measurement of photovoltaic current-voltage characteristics
|
Published |
На языке оригинала
|
1382,00
|
|
|
Photovoltaic devices--Part 2:Requirements for reference solar cells
|
Published |
На языке оригинала
|
1670,00
|
|
|
Photovoltaic devices--Part 3:Measurement principles for terrestrial photovoltaic(PV) solar devices with reference spectral irradiance data
|
Published |
На языке оригинала
|
1786,00
|
|
|
Procedures for temperature and irradiance corrections to measured I-V characteristics of crystalline silicon photovoltaic devices
|
Published |
На языке оригинала
|
1670,00
|
|
|
Photovoltaic devices--Part 5:Determination of the equivalent cell temperature(ECT) of photovoltaic (PV) devices by the open-circuit voltage method
|
Published |
На языке оригинала
|
1670,00
|
|
|
Electrical insulating materials used under severe ambient conditions―Test methods for evaluating resistance to tracking and erosion
|
Published |
На языке оригинала
|
1786,00
|
|
|
Electrical insulating materials used under severe ambient conditions—Test methods for evaluating resistance to tracking and erosion
|
Published |
На языке оригинала
|
2189,00
|
|
|
Resin based reactive compounds used for electrical insulation--Part 2:Methods of test--Methods for coating pourders for electrical purposes
|
Published |
На языке оригинала
|
1786,00
|
|
|
Test method for measuring resistivity of silicon wafer using spreading resistance probe
|
Published |
На языке оригинала
|
1670,00
|
|
|
Test method for thickness and total thickness variation of silicon slices
|
Published |
На языке оригинала
|
1670,00
|
|
|
Test methods for bow of silicon wafers
|
Published |
На языке оригинала
|
1670,00
|
|
|
Test method for measuring warp on silicon slices by noncontact scanning
|
Published |
На языке оригинала
|
1670,00
|
|
|
Testing methods for surface flatness of silicon slices
|
Published |
На языке оригинала
|
1382,00
|
|
Страницы: ... / 19 / 20 / 21 / 22 / 23 / 24 / 25 / 26 / 27 / 28 / 29 / 30 / 31 / 32 ... / 139 |