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Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
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Semiconductor devices - Integrated circuits - Part 11:Sectional specification for semiconductor integrated circuits excluding hybrid circuits
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Semiconductor devices - Integrated circuits - Part 11 - 1:Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
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Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
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Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination
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Semiconductor devices - Intergrated circuits - Part 23-1: Hybrid integrated circuits and film structures - Manufacturing line certification - Generic specification
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Semiconductor devices - Integrated circuits - Part 23-3: Hybrid integrated circuits and film structures - Manufacturing line certification - Manufactures self-audit checklist and report
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Semiconductor devices - Mechanical and climatic test methods - Part 1:General
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Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
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Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
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Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state,highly accelerated stress test(HAST)
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Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
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Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
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Semiconductor devices - Mechanical and climatic test methods - Part 8:Sealing
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Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
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Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
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Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
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Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
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Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
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Semiconductor devices - Mechanical and climatic test methods - Part 14:Robustness of terminations(lead integrity)
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