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Distribution automation using distribution line carrier systems - Part 4-41:Data communication protocols - Application protocols - Distribution line message specification
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Distribution automation using distribution line carrier systems - Part 4-42:Data communication protocols - Application protocol - Application layer
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Distribution automation using distribution line carrier systems - Part 4-61:Data communication protocols - Network layer - Connectionless protocol
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Distribution automation using distribution line carrier systems - Part 4-511:Data communication protocols - Systems management - CIASE protocol
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Distribution automation using distribution line carrier systems - Part 4-512:Data communication protocols - System management using profile 61334 - 5-1 - Management Information Base(MIB)
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Distribution automation using distribution line carrier systems - Part 5-1:Lower layer profiles - The spread frequency shift keying(S-FSK) profile
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Distribution automation using distribution line carrier systems - Part 5-2:Lower layer profiles - Frequency shift keying(FSK) profile
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Distribution automation using distribution line carrier systems - Part 5-3:Lower-layer profiles - Spread spectrum adaptive wideband(SS-AW) profile
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Distribution automation using distribution line carrier systems - Part 5-4:Lower layer profiles - Multi-carrier modulation(MCM) profile
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Distribution automation using distribution line carrier systems - Part 5-5:Lower layer profiles - Spread spectrum-fast frequency hopping(SS-FFH) profile
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Distribution automation using distribution line carrier systems - Part 6:A-XDR encoding rule
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Filters using waveguide type dielectric resonators - Part 1: Generic specification
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Filters using waveguide type dielectric resonators - Part 2:Guidance for use
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Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency
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Waveguide type dielectric resonators в”Ђ Part 1-4: General information and test conditions в”Ђ Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency
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Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
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Waveguide type dielectric resonators в”Ђ Part 1: Generic specification
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Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications
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Waveguide type dielectric resonators - Part 4-1: Blank detail specification
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Waveguide type dielectric resonators - Part 4: Sectional specification
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