| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 22%)
в рублях |
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Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
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На языке оригинала
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4484,00
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Transmitting and receiving equipment for radiocommunication - Radio-over-fibre technologies and their performance standard - Part 4: Radio-over-fibre-based indoor distributed antenna system(DAS) for 5G
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На языке оригинала
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2562,00
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Eyewear display - Part 20-10: Fundamental measurement methods - Optical properties
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На языке оригинала
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4484,00
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Eyewear display - Part 20-20: Fundamental measurement methods - Image quality
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На языке оригинала
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4484,00
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Eyewear display - Part 22-10: Specific measurement methods for AR type - Optical properties
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На языке оригинала
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4484,00
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Guidelines for the measurement method of power durability for surface acoustic wave(SAW) and bulk acoustic wave(BAW) devices in radio frequency(RF) applications
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На языке оригинала
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4484,00
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Semiconductor devices - Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
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На языке оригинала
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4484,00
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Test method for mechanical property of flexible opto – electric circuit boards under thermal stress
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На языке оригинала
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2562,00
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Safety guideline for semiconductor fabrication equipment
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На языке оригинала
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14091,00
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Test methods for electrical materials, interconnection structures and assemblies - Part 6:Test methods for materials used in manufacturing electronic assemblies
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На языке оригинала
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4484,00
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Liquid crystal display devices - Part 20-1: Visual inspection - Monochrome LCD display cells(excluding all active matrix liquid crystal cells)
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На языке оригинала
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2562,00
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Liquid crystal display devices - Part 20-2: Visual inspection - Monochrome LCD display modules(excluding all active matrix liquid crystal modules)
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На языке оригинала
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2562,00
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Liquid crystal display devices - Part 20-3: Visual inspection - Active matrix colour liquid crystal display modules
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На языке оригинала
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2562,00
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Liquid crystal display devices - Part 6:Measuring methods for liquid crystal modules - Transmissive type
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На языке оригинала
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4484,00
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Plasma display panels - Part 3-1: Mechanical interface
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На языке оригинала
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1537,00
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Electrical interface of plasma display panels
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На языке оригинала
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2562,00
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Plasma display panels - Part 4: Environmental and mechanical endurance test methods
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На языке оригинала
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2562,00
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Electronic paper display - Part 3-2: Measuring method - Electro-optical
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На языке оригинала
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4484,00
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Electronic component management plans
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На языке оригинала
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2562,00
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Use of semiconductor devices outside manufacturers specified temperature range
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На языке оригинала
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6405,00
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