| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
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Fixed capacitors for use in electronic equipment - Part 17: Sectional specification: Fixed metallized polypropylene film dielectric a.c. and pulse capacitors
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Fixed capacitors for use in electronic equipment - Part 18: Sectional specification - Fixed aluminium electrolytic surface mount capacitors with solid(MnO 2 ) and non-solid electrolyte
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Fixed capacitors for use in electronic equipment - Part 19: Sectional specification: Fixed metallized polyethylene-terephthalate film dielectric surface mount d.c. capacitors
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Fixed capacitors for use in electronic equipment - Part 20: Sectional specification - Fixed metallized polyphenylene sulfide film dielectric surface mount d.c. capacitors
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Fixed capacitors for use in electronic equipment - Part21: Sectional specification:Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1
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Fixed capacitors for use in electronic equipment - Part 22: Sectional specification - Fixed surface mount multilayer capacitors of ceramic dielectric, Class
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Fixed capacitors for use in electronic equipment - Part 23: Sectional specification - Fixed metallized polyethylene naphthalate film dielectric surface mount d.c. capacitors
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Fixed capacitors for use in electronic equipment - Part 24: Sectional specification - Fixed tantalum electrolytic surface mount capacitors with conductive polymer solid electrolyte
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Fixed capacitors for use in electronic equipment - Part 25: Sectional specification - Fixed aluminium electrolytic surface mount capacitors with conductive polymer solid electrolyte
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Potentiometers for use in electronic equipment Part 1: Generic specification
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Potentiometers for use in electronic equipment Part 2: Sectional specification. Lead-screw actuated and rotary preset potentiometer.
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Potentiometers for use in electronic equipment - Part 5:Sectional specification:Single-turn rotary low-power wirewound and non-wirewound potentiometers
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Method of measurement of non-linearity in resistors
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Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
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Measurement of quartz crystal unit parameters by zero phase technique in a p-network - Part 2:Phase offset method for measurement of motional capacitance of quartz crystal units
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Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
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Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence(DLD)
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Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
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Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
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Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonance of piezoelectric crystal units
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