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Safety of machinery - Electro-sensitive protective equipment - Part 4-3: Particular requirements for equipment using vision based protective devices(VBPD) - Additional requirements when using stereo vision techniques(VBPDST)
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Power installations exceeding 1 kV a.c. and 1.5 kV d.c. - Part 2: d.c.
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Guidance on the measurement of hydrophobicity of insulator surfaces
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Portable and hand-held multimedia equipment - Mobile computers - Battery run-time measurement
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Material declaration for products of and for the electrotechnical industry - Part 1: Guidance on the implementation of IEC 62474
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Reliability and availability evaluation of HVDC systems - Part 1: HVDC systems with line commutated converters
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Distributed energy resources connection with the grid
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Measurement of internal electric field in insulating materials - Pressure wave propagation method
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Industrial-process measurement, control and automation system interface between industrial facilities and the smart grid
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Industrial-process measurement, control and automation - Part 1: System interface between industrial facilities and the smart grid
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Charging cables for electric vehicles of rated voltages up to and including 0.6/1 kV - Part 4-2: Cables for DC charging according to mode 4 of KS R IEC 61851-1 - Cables intended to be used with a thermal management system
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Microgrids - Part 1: Guidelines for microgrid projects planning and specification
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Microgrids - Part2: Guidelines for operation
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General lighting - Organic light emitting diode (OLED) products and related equipment - Terms and definitions
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General requirements for residual current operated protective devices for DC systems
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Resistance welding equipment - Transformers - General specifications applicable to all transformers
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Resistance welding - Transformer-rectifier for welding guns with integrated transformers - Transformer-rectifier units operating at 1 000 Hz frequency
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Solid-state relays - Safety requirements
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Glossary of terms relating to superconductors
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Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method
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