Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%) в рублях |
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Electronic components - Long-term storage of electronic semiconductor devices -- Part 1: General (IEC 62435-1:2017) (english version)
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На английском языке
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Electronic components - Long-term storage of electronic semiconductor devices -- Part 2: Deterioration mechanisms (IEC 62435-2:2017) (english version)
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На английском языке
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Electronic components - Long-term storage of electronic semiconductor devices -- Part 2: Deterioration mechanisms (IEC 62435-2:2017) (german version)
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На немецком языке
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Electronic components - Long-term storage of electronic semiconductor devices -- Part 5: Die and wafer devices (IEC 62435-5:2017) (english version)
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На английском языке
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Electronic components - Long-term storage of electronic semiconductor devices -- Part 5: Die and wafer devices (IEC 62435-5:2017) (german version)
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На немецком языке
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Mechanical structures for electrical and electronic equipment - Thermal management for cabinets in accordance with IEC 60297 and IEC 60917 series -- Part 5: Cooling performance evaluation for indoor cabinets ( IEC 62610-5:2016) (english version)
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На английском языке
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Mechanical structures for electrical and electronic equipment - Thermal management for cabinets in accordance with IEC 60297 and IEC 60917 series -- Part 5: Cooling performance evaluation for indoor cabinets ( IEC 62610-5:2016) (german version)
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На немецком языке
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Semiconductor devices - Semiconductor interface for human body communication -- Part 1: General requirements ( IEC 62779-1:2016) (german version)
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На немецком языке
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Semiconductor devices - Semiconductor interface for human body communication -- Part 1: General requirements ( IEC 62779-1:2016) (english version)
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На английском языке
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Semiconductor devices - Semiconductor interface for human body communication -- Part 2: Characterization of interfacing performances ( IEC 62779-2:2016) (english version)
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На английском языке
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Semiconductor devices - Semiconductor interface for human body communication -- Part 2: Characterization of interfacing performances ( IEC 62779-2:2016) (german version)
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На немецком языке
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Semiconductor devices - Semiconductor interface for human body communication -- Part 3: Functional type and its operational conditions ( IEC 62779-3:2016) (english version)
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На английском языке
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Semiconductor devices - Semiconductor interface for human body communication -- Part 3: Functional type and its operational conditions ( IEC 62779-3:2016) (german version)
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На немецком языке
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators -- Part 1: Basic methods for the measurement (IEC 62884-1:2017) (german version)
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На немецком языке
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators -- Part 1: Basic methods for the measurement (IEC 62884-1:2017) (english version)
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На английском языке
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0,00
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators -- Part 2: Phase jitter measurement method ( IEC 62884-2:2017) (german version)
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На немецком языке
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators -- Part 2: Phase jitter measurement method ( IEC 62884-2:2017) (english version)
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На английском языке
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0,00
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Blank Detail Specification: Wirewound inductors with ceramic or ferrite core - Assessment level E (Corrigendum) (german version)
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На немецком языке
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Blank Detail Specification: Wirewound inductors with ceramic or ferrite core - Assessment level P (Corrigendum) (german version)
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На немецком языке
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Detail specification: Fixed low power film SMD resistors - Rectangular - Stability classes 1; 2 (english version)
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На английском языке
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