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BS ISO 21222:2020 |  на печать | | Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method |
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| | Библиография | Обозначение | BS ISO 21222:2020 | | Заглавие на английском языке | Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method | | Количество страниц оригинала | 26 | |
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