| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 22%)
в рублях |
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Quartz crystal units of assessed quality -- Part 1: Generic specification (IEC 60122-1:2002 + A1:2017) (english version)
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На английском языке
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33936,00
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Quartz crystal units of assessed quality -- Part 1: Generic specification (IEC 60122-1:2002 + A1:2017) (german version)
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На немецком языке
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23409,00
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Measurement of quartz crystal unit parameters -- Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016) (german version)
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На немецком языке
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13791,00
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Measurement of quartz crystal unit parameters -- Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016) (english version)
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На английском языке
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9311,00
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Piezoelectric, dielectric and electrostatic oscillators of assessed quality -- Part 1: Generic specification (IEC 60679-1:2017) (german version)
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На немецком языке
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19748,00
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Piezoelectric, dielectric and electrostatic oscillators of assessed quality -- Part 1: Generic specification (IEC 60679-1:2017) (english version)
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На английском языке
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28621,00
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Synthetic quartz crystal - Specifications and guidelines for use ( IEC 60758:2016) (german version)
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На немецком языке
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26216,00
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Synthetic quartz crystal - Specifications and guidelines for use ( IEC 60758:2016) (english version)
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На английском языке
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37932,00
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Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules ( IEC 61240:2016) (english version)
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На английском языке
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14640,00
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Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules ( IEC 61240:2016) (german version)
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На немецком языке
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13791,00
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Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods ( IEC 62276:2016) (german version)
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На немецком языке
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23409,00
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Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods ( IEC 62276:2016) (english version)
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На английском языке
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28621,00
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators -- Part 1: Basic methods for the measurement (IEC 62884-1:2017) (german version)
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На немецком языке
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13791,00
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators -- Part 1: Basic methods for the measurement (IEC 62884-1:2017) (english version)
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На английском языке
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42588,00
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators -- Part 2: Phase jitter measurement method ( IEC 62884-2:2017) (german version)
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На немецком языке
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17962,00
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators -- Part 2: Phase jitter measurement method ( IEC 62884-2:2017) (english version)
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На английском языке
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19296,00
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Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors (IEC 60122-4:2019) (german version)
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На немецком языке
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13791,00
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Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors (IEC 60122-4:2019) (english version)
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На английском языке
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9311,00
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Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures (english version)
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На английском языке
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50581,00
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Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures (german version)
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На немецком языке
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40696,00
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