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BS ISO 16413:2020 |  на печать | | Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting |
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| | Библиография | Обозначение | BS ISO 16413:2020 | | Заглавие на английском языке | Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting | | Количество страниц оригинала | 42 | |
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