BS ISO 16413:2020
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
На языке оригинала
Заказать перевод
Библиография
Обозначение
BS ISO 16413:2020
Заглавие на английском языке
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
Количество страниц оригинала
42
Постоянная ссылка
https://www.standards.ru/document/6806545.aspx