Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%) в рублях |
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Semiconductor device—Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices—Part 2: Test method for defects using optical inspection
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Published |
На языке оригинала
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2477,00
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Semiconductor device—Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices—Part 3: Test method for defects using photoluminescence
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Published |
На языке оригинала
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2477,00
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Test method of performance for lobster eye micro pore optics
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Published |
На языке оригинала
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2189,00
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Three dimensional integrated circuit—Part 1:Terminologies and definitions
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Published |
На языке оригинала
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2189,00
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Three dimensional integrated circuits—Part 2:Alignment of stacked dies having fine pitch interconnect
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Published |
На языке оригинала
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1786,00
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Quality and technical requirements for metal packages used for integrated circuits
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Published |
На языке оригинала
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3398,00
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Laser display devices—Part 1-2:Vocabulary and letter symbols
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Published |
На языке оригинала
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1786,00
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Laser display devices—Part 5-1: Measurement of optical performance for laser front projection
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Published |
На языке оригинала
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4032,00
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Laser display devices—Part 5-2: Optical measuring methods of speckle contrast
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Published |
На языке оригинала
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2189,00
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Laser display devices—Part 5-3: Measuring methods of image quality for laser projection displays
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Published |
На языке оригинала
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2822,00
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Laser display devices—Part 5-4: Optical measuring methods of colour speckle
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Published |
На языке оригинала
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4954,00
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General specification for uniform light source
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Published |
На языке оригинала
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2477,00
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Direct writing imaging exposure equipment
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Published |
На языке оригинала
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2189,00
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Test method for performance parameters of optical frequency comb in precision optical frequency measurement
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Published |
На языке оригинала
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1786,00
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Specification for indoor LED displays
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Published |
На языке оригинала
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3110,00
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Measuring methods of optical performance for curved organic light emitting diode (OLED) lighting
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Published |
На языке оригинала
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1786,00
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Electronic paper displays—Part 1-1: Terminology
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Published |
На языке оригинала
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1786,00
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Electronic paper displays—Part 3-1: Optical measuring methods
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Published |
На языке оригинала
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5299,00
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Electronic paper displays—Part 3-2: Measuring method electro-optical
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Published |
На языке оригинала
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2477,00
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Remote operation and maintenance of integrated circuit packaging equipment—Data acquisition
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Published |
На языке оригинала
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2477,00
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