| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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General rules for chemical analysis of nickel and nickel alloy castings
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На языке оригинала
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1555,00
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Methods for determination of phosphorous in nickel and nickel alloy castings
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На языке оригинала
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1555,00
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Method for determination of molybdenum in nickel alloys
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На языке оригинала
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1555,00
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Method for determination of vanadium in nickel alloys
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На языке оригинала
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1555,00
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Methods for determination of tungsten in nickel alloys
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На языке оригинала
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2592,00
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Methods for X-ray fluorescence spectrometric analysis of ferroniobium
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На языке оригинала
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2592,00
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Evaluation of carbon nanotube soots and non-carbon content - Thermogravimetric analysis
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На языке оригинала
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2592,00
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Evaluation of content of single-walled carbon nanotube using UV-VIS-NIR absorption spectroscopy
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На языке оригинала
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2592,00
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Nickel alloys - Flame atomic absorption spectrometric analysis - Part 7:Determination of aluminium content
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На языке оригинала
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1555,00
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Nickel alloys - Flame atomic absorption spectrometric analysis - Part 8:Determination of silicon content
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На языке оригинала
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1555,00
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Nickel alloys - Flame atomic absorption spectrometric analysis - Part 9:Determination of vanadium content
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На языке оригинала
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1555,00
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Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
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На языке оригинала
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4536,00
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Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials
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На языке оригинала
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4536,00
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Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
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На языке оригинала
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4536,00
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Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OES) - Introduction to use
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На языке оригинала
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2592,00
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Surface chemical analysis - Information formats
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На языке оригинала
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2592,00
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Surface chemical analysis - Data transfer format
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На языке оригинала
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6480,00
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Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
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На языке оригинала
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1555,00
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Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
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На языке оригинала
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1555,00
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Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
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На языке оригинала
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4536,00
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