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Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
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Semiconductor devices - Mechanical and climatic test methods - Part 14:Robustness of terminations(lead integrity)
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Semiconductor devices - Mechanical and climatic test methods - Part 16:Particle impact noise detection(PIND)
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Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
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Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation(total dose)
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Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
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Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
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Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
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Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength
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Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
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Semiconductor devices - Mechanical and climatic test methods - Part 24:Accelerated moisture resistance - Unbiased HAST
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Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge(ESD) sensitivity testing - Charged device model(CDM) - Device level
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Semiconductor devices - Mechanical and climatic test methods - Part 31:Flammability of plastic-encapsulated devices(internally induced)
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Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices(externally induced)
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Semiconductor devices - Mechanical and climatic test methods - Part 34:Power cycling
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Semiconductor devices - Mechanical and climatic test methods - Part 39:Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
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Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
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Semiconductor devices - Mechanical and climate test methods
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Components for low - voltage surge protective devices - Part 321:Specifications for avalanche breakdown diode(ABD)
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Components for low - voltage surge protective devices - Part 341: Specification for thyristor surge suppressors(TSS)
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